| Publication Type | journal article |
| School or College | College of Engineering |
| Department | Materials Science & Engineering |
| Creator | Liu, Feng |
| Other Author | Li, Shao-Chun; Han, Y.; Jia, Jin-Feng; Xue, Qi-Kun |
| Title | Determination of the Ehrlich-Schwoebel barrier in epitaxial growth of thin films |
| Date | 2006-11 |
| Description | We demonstrate an approach for determining the "effective" Ehrlich-Schwoebel (ES) step-edge barrier, an important kinetic constant to control the interlayer mass transport in epitaxial growth of thin films. The approach exploits the rate difference between the growth and/or decay of an adatom and a vacancy two-dimensional island, which allows the "effective" ES barrier to be determined uniquely by fitting with a single parameter. Application to growth of Pb islands produces an effective ES barrier of ~83±10 meV on Pb(111) surface at room temperature. |
| Type | Text |
| Publisher | American Physical Society |
| Journal Title | Physical Review B |
| Volume | 74 |
| Issue | 19 |
| DOI | 10.1103/PhysRevB.74.195428 |
| citatation_issn | 1098-0121 |
| Subject | Ehrlich-Schwoebel barrier; Epitaxial growth; Step-edge barrier; Adatoms |
| Subject LCSH | Thin films; Epitaxy; Surface chemistry |
| Language | eng |
| Bibliographic Citation | Li, S.-C., Han, Y., Jia, J.-F., Xue, Q.-K., & Liu F. (2006). Determination of the Ehrlich-Schwoebel barrier in epitaxial growth of thin films. Physical Review B, 74(19), 195428. |
| Rights Management | © American Physical Society http://dx.doi.org/10.1103/PhysRevB.74.195428 |
| Format Medium | application/pdf |
| Format Extent | 272,167 bytes |
| Identifier | ir-main,12137 |
| ARK | ark:/87278/s6jd5fg5 |
| Setname | ir_uspace |
| ID | 707150 |
| Reference URL | https://collections.lib.utah.edu/ark:/87278/s6jd5fg5 |