Determination of the Ehrlich-Schwoebel barrier in epitaxial growth of thin films

Update Item Information
Publication Type Journal Article
School or College College of Engineering
Department Materials Science & Engineering
Creator Liu, Feng
Other Author Li, Shao-Chun; Han, Y.; Jia, Jin-Feng; Xue, Qi-Kun
Title Determination of the Ehrlich-Schwoebel barrier in epitaxial growth of thin films
Date 2006-11
Description We demonstrate an approach for determining the "effective" Ehrlich-Schwoebel (ES) step-edge barrier, an important kinetic constant to control the interlayer mass transport in epitaxial growth of thin films. The approach exploits the rate difference between the growth and/or decay of an adatom and a vacancy two-dimensional island, which allows the "effective" ES barrier to be determined uniquely by fitting with a single parameter. Application to growth of Pb islands produces an effective ES barrier of ~83±10 meV on Pb(111) surface at room temperature.
Type Text
Publisher American Physical Society
Journal Title Physical Review B
Volume 74
Issue 19
DOI 10.1103/PhysRevB.74.195428
citatation_issn 1098-0121
Subject Ehrlich-Schwoebel barrier; Epitaxial growth; Step-edge barrier; Adatoms
Subject LCSH Thin films; Epitaxy; Surface chemistry
Language eng
Bibliographic Citation Li, S.-C., Han, Y., Jia, J.-F., Xue, Q.-K., & Liu F. (2006). Determination of the Ehrlich-Schwoebel barrier in epitaxial growth of thin films. Physical Review B, 74(19), 195428.
Rights Management (c) American Physical Society http://dx.doi.org/10.1103/PhysRevB.74.195428
Format Medium application/pdf
Format Extent 272,167 bytes
Identifier ir-main,12137
ARK ark:/87278/s6jd5fg5
Setname ir_uspace
ID 707150
Reference URL https://collections.lib.utah.edu/ark:/87278/s6jd5fg5