Publication Type |
Journal Article |
School or College |
College of Engineering |
Department |
Computing, School of |
Creator |
Brunvand, Erik L. |
Other Author |
Khoche, Ajay |
Title |
Testing self-timed circuits using partial scan |
Date |
1995 |
Description |
This paper presents a partial scan method for testing both the control and data path parts of macromodule based self-timed circuits for stuck-at faults. Compared with other proposed test methods for testing control paths in self-timed circuits, this technique offers better fault coverage under a stuck-at input model than methods using self-checking properties, and requires fewer storage elements to be made scanable than full scan approaches with similar fault coverage. A new method is proposed to test the sequential network in the control path in this partial scan environment. The partial scan approach has also been applied to datapaths, where structural analysis is used to select which latches should be made scannable to break cycles in the circuit. Experimental data is presented to show that high fault coverage is possible using this method with only a subset of storage elements in the control and data paths being made scannable. |
Type |
Text |
Publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
First Page |
160 |
Last Page |
169 |
Language |
eng |
Bibliographic Citation |
Khoche, A., & Bruncand, E. L. (1995). Testing self-timed circuits using partial scan in 2nd Working Conference on Asynchronous Design Methodologies. South Bank University, 160-9. |
Rights Management |
(c) 1995 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Format Medium |
application/pdf |
Format Extent |
1,004,568 bytes |
Identifier |
ir-main,15752 |
ARK |
ark:/87278/s6765zf2 |
Setname |
ir_uspace |
ID |
702877 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6765zf2 |