Publication Type |
Journal Article |
School or College |
College of Engineering |
Department |
Materials Science & Engineering |
Creator |
Liu, Feng |
Other Author |
Li, Shao-Chun; Han, Y.; Jia, Jin-Feng; Xue, Qi-Kun |
Title |
Determination of the Ehrlich-Schwoebel barrier in epitaxial growth of thin films |
Date |
2006-11 |
Description |
We demonstrate an approach for determining the "effective" Ehrlich-Schwoebel (ES) step-edge barrier, an important kinetic constant to control the interlayer mass transport in epitaxial growth of thin films. The approach exploits the rate difference between the growth and/or decay of an adatom and a vacancy two-dimensional island, which allows the "effective" ES barrier to be determined uniquely by fitting with a single parameter. Application to growth of Pb islands produces an effective ES barrier of ~83±10 meV on Pb(111) surface at room temperature. |
Type |
Text |
Publisher |
American Physical Society |
Journal Title |
Physical Review B |
Volume |
74 |
Issue |
19 |
DOI |
10.1103/PhysRevB.74.195428 |
citatation_issn |
1098-0121 |
Subject |
Ehrlich-Schwoebel barrier; Epitaxial growth; Step-edge barrier; Adatoms |
Subject LCSH |
Thin films; Epitaxy; Surface chemistry |
Language |
eng |
Bibliographic Citation |
Li, S.-C., Han, Y., Jia, J.-F., Xue, Q.-K., & Liu F. (2006). Determination of the Ehrlich-Schwoebel barrier in epitaxial growth of thin films. Physical Review B, 74(19), 195428. |
Rights Management |
(c) American Physical Society http://dx.doi.org/10.1103/PhysRevB.74.195428 |
Format Medium |
application/pdf |
Format Extent |
272,167 bytes |
Identifier |
ir-main,12137 |
ARK |
ark:/87278/s6jd5fg5 |
Setname |
ir_uspace |
ID |
707150 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6jd5fg5 |