Publication Type |
Journal Article |
School or College |
College of Engineering |
Department |
Electrical & Computer Engineering |
Creator |
Harrison, Reid R. |
Title |
Wide-linear-range subthreshold CMOS transconductor employing the back-gate effect |
Date |
2002-01-01 |
Description |
We present a CMOS circuit that utilizes the back-gate effect to extend the linear range of a subthreshold MOS transconductor. Previous designs of wide-linear-range transconductors using bipolar transistors employed multiple differential pairs with input offset voltages used to shift the individual transfer functions. These voltages were chosen to maximize the linear range of the summed differential pair currents. Equivalent offset voltages were generated by sizing emitter areas appropriately. Similar techniques may be applied to MOS circuits by scaling WIL ratios, but transistor size increases exponentially as we extend the linear range by adding more differential pairs. We introduce a method of adding equivalent offset voltages by biasing the back gate (i.e., body) of well devices appropriately. Test circuits built in a standard 0.5μm CMOS process and using few transistors exhibit improved linear range over standard single-differential pair transconductors. |
Type |
Text |
Publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
Journal Title |
IEEE International Symposium on Circuits and Systems |
Volume |
3 |
First Page |
727 |
Last Page |
30 |
Language |
eng |
Bibliographic Citation |
Harrison, R. R. (2002). Wide-linear-range subthreshold CMOS transconductor employing the back-gate effect. Proceedings of the 2002 IEEE International Symposium on Circuits and Systems (ISCAS 2002), 3, 727-30. |
Rights Management |
(c)2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Format Medium |
application/pdf |
Format Extent |
324,435 bytes |
Identifier |
ir-main,13994 |
ARK |
ark:/87278/s6t15mz6 |
Setname |
ir_uspace |
ID |
704411 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6t15mz6 |