Total ionizing dose characterization of a commercially fabricated asynchronous FFT for space applications

Update Item Information
Publication Type Journal Article
School or College College of Engineering
Department Electrical & Computer Engineering
Creator Stevens, Kenneth
Other Author Barnhart, D; Duggan, P.; Suter, B.; Brothers, C.
Title Total ionizing dose characterization of a commercially fabricated asynchronous FFT for space applications
Date 2000
Description The total ionizing dose characterization of the radiation-hardened implementation of a novel architecture for high-performance, energy efficiency FFT engines is presented. Simulations and test chip measurement results indicate that a radiation-tolerant 1024-point FFT based on this architecture will achieve an efficiency of 120 nJ/Unit-Transform and 2 ms throughput. The proof-of-concept chip shows a total ionizing dose hardness of 1 Mrad (SiO2).
Type Text
Publisher Institute of Electrical and Electronics Engineers (IEEE)
Language eng
Bibliographic Citation Barnhart, D., Duggan, P., Suter, B., Brothers, C., & Stevens, K. S. (2000). Total ionizing dose characterization of a commercially fabricated asynchronous FFT for space applications. Journal of Radiation Effects, Research, and Engineering. March.
Rights Management (c) 2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Format Medium application/pdf
Format Extent 99,553 bytes
Identifier ir-main,15299
ARK ark:/87278/s6m623ks
Setname ir_uspace
ID 704458
Reference URL https://collections.lib.utah.edu/ark:/87278/s6m623ks