| Publication Type |
Journal Article |
| School or College |
College of Engineering |
| Department |
Electrical & Computer Engineering |
| Creator |
Stevens, Kenneth |
| Other Author |
Barnhart, D; Duggan, P.; Suter, B.; Brothers, C. |
| Title |
Total ionizing dose characterization of a commercially fabricated asynchronous FFT for space applications |
| Date |
2000 |
| Description |
The total ionizing dose characterization of the radiation-hardened implementation of a novel architecture for high-performance, energy efficiency FFT engines is presented. Simulations and test chip measurement results indicate that a radiation-tolerant 1024-point FFT based on this architecture will achieve an efficiency of 120 nJ/Unit-Transform and 2 ms throughput. The proof-of-concept chip shows a total ionizing dose hardness of 1 Mrad (SiO2). |
| Type |
Text |
| Publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
| Language |
eng |
| Bibliographic Citation |
Barnhart, D., Duggan, P., Suter, B., Brothers, C., & Stevens, K. S. (2000). Total ionizing dose characterization of a commercially fabricated asynchronous FFT for space applications. Journal of Radiation Effects, Research, and Engineering. March. |
| Rights Management |
(c) 2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
| Format Medium |
application/pdf |
| Format Extent |
99,553 bytes |
| Identifier |
ir-main,15299 |
| ARK |
ark:/87278/s6m623ks |
| Setname |
ir_uspace |
| ID |
704458 |
| Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6m623ks |
