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CreatorTitleDescriptionSubjectDate
1 Armentrout, Peter B.Dissociative charge transfer reactions of Ar+, Ne+, and He+ with CF4 from thermal to 50 eVGuided ion-beam techniques are used to measure the cross sections for reaction of CF4 with Ar+, Ne+, and H e + from thermal to 50 eV. Dissociative charge transfer followed by successive loss of F atoms are the major processes observed. Only CFx+ (x = 1,2,3) products are observed in the reactions of ...Ion-molecule reactions; Transfer reactions; Carbon tetrafluoride; Rare gas ions; Exothermic reactions; Endothermic reactions; Plasma systems1990
2 Armentrout, Peter B.Spin-orbit state-selected reactions of Xe+(2P3/2 and 2P1/2) with H2, D2, and HDSpin-orbit state-selected reactions of X e + (2Pj ), j = 3/2 and 1/2, with isotopic molecular hydrogen (H2 , D2 , and HD) to form X e H + and XeD + are studied using guided ion beam mass spectrometry. Reaction cross sections are determined as a function of reactant kinetic energy from near thermal ...Spin-orbit; Xenon ions; Hydrogen isotopes; Isotope effects; Ion-molecule reactions1989
3 Armentrout, Peter B.Kinetic energy dependence of dissociative charge-transfer reactions of He+, Ne+, Ar+, Kr+, and Xe+ with silaneGuided ion-beam techniques are used to measure the cross sections as a function of kinetic energy for reaction of SiH4 with He +, Ne +, Ar +, Kr +, and Xe +. State-specific data for the 2P3/2 ground spin-orbit states of Kr+ and Xe+ are also obtained.Silane; Charge-transfer reactions; Ion-molecule reactions; Ion energy; Rare gas ions; Plasma systems1990
4 Armentrout, Peter B.Reactions of Ar+, Ne+, and He+ with SiF4 from thermal energy to 50 eV c.m.Guided ion-beam techniques are used to measure the cross sections for reaction of SiF4 with Ar+, Ne+, and He+ from thermal to 50 eV. Charge transfer followed by loss of F atoms are the sole processes observed. All SiFx + (x = 0-4) products are observed, except for SiF4 + from reaction with Ne+ and ...Ion-molecule reactions; Tetrafluorosilane; Rare gas ions; Endothermic reactions; Plasma systems1989
5 Armentrout, Peter B.Energetics and dynamics in the reaction of Si+ with SiF4. Thermochemistry of SiFx and SiFx+ (x=1,2,3)The title reaction is studied using guided ion beam mass spectrometry. Absolute reaction cross sections are measured as a function of kinetic energy from thermal to 40 eV, and three endothermic product channels are observed. The dominant SiF+ + SiF3 channel is only slightly endothermic, while the ...Silicon fluoride; Ion-molecule reactions; Kinetic energy; Threshold behavior; Endothermic reactions1988
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