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| Creator | Title | Description | Subject | Date | ||
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Furse, Cynthia M. | Analysis of spread spectrum time domain reflectometry for wire fault location | Spread spectrum time domain reflectometry (SSTDR) and sequence time domain reflectometry have been demonstrated to be effective technologies for locating intermittent faults on aircraft wires carrying typical signals in flight. This paper examines the parameters that control the accuracy, latency, ... | Spread spectrum; Sequence time domain reflectometry; STDR; SSTDR; Wire fault location; Aging wire detection; Arc detection | 2005-12 |
| 2 |
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Horch, Kenneth W.; Dhillon, Gurpreet S. | Direct neural sensory feedback and control of a prosthetic arm | Evidence indicates that user acceptance of modern artificial limbs by amputees would be significantly enhanced by a system that provides appropriate, graded, distally referred sensations of touch and joint movement, and that the functionality of limb prostheses would be improved by a more natural co... | Peripheral Nerve Implant; Prosthetic Limb Control; Sensory Feedback | 2005-12 |
| 3 |
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Furse, Cynthia M. | Feasibility of spread spectrum sensors for location of arcs on live wires | Spread spectrum methods are an important emerging class of sensors that have the potential to locate small, intermittent faults on energized aircraft power circuit wires. Previous work has demonstrated the use of these methods for hard faults (open and short circuits). This paper extends that work ... | Spread spectrum sensors; Wire fault location; Live wires | 2005-12 |
| 4 |
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Furse, Cynthia M. | Mixed-signal reflectometer for location of faults on aging wiring | Location of faults on aging cables is of great interest to maintainers of aircraft, cars, power distribution systems, communication systems, etc. One class of methods for locating faults is frequency domain reflectometry (FDR), using sine waves as the forcing function. A new frequency domain method... | Mixed signal reflectometer; Fault location; Aging wiring; Nondestructive evaluation; Reflectometry | 2005-12 |
| 5 |
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Liu, Feng | Self-organization of semiconductor nanocrystals by selective surface faceting | The formation and ordering of Si nanocrystals in dewetting and agglomeration of the thin single crystalline Si layer in silicon-on-insulator has been investigated using low-energy electron microscopy. The evolution of the Si dewetting and agglomeration is captured in real time, revealing the detai... | Self-organization; Surface faceting; Silicon nanocrystals; Dewetting | 2005-12 |
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