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| Creator | Title | Description | Subject | Date | ||
|---|---|---|---|---|---|---|
| 1 |
 | Williams, Clayton C. | Micromachined submicrometer photodiode for scanning probe microscopy | A submicrometer photodiode probe with a sub-50 nanometer tip radius has been developed for optical surface characterization on a nanometer scale. The nanoprobe is built to detect subwavelength optical intensity variations in the near field of an illuminated surface. The probe consists of an Al-Si Sc... | Submicrometer photodiode; Scanning probe microscopy; Nanobrobes | 1995 |
| 2 |
 | Williams, Clayton C.; Huang, Yufeng | Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy | Quantitative dopant profile measurements are performed on a nanometer scale by scanning capacitance microscopy (SCM). An atomic force microscope is used to position a nanometer scale tip at a semiconductor surface, and local capacitance change is measured as a function of sample bias. A new feedback... | Dopant profile; Capacitance change; Scanning capacitance microscopy; Feedback control | 1995 |
| 3 |
 | Vardeny, Zeev Valentine | Symmetric light emitting divices from poly(p-di ethynylene phenylene) (p-di phenylene vinylene) derivatives | Light emitting devices were fabricated from 2,5-dialkoxy derivatives of poly(p-di ethynylene phenylene-p-di phenylene vinylene) (PDEPDPV) sandwiched between indium tin oxide (ITO) and Al. The current-voltage (Iel-V) curve, electroluminescence (EL) intensity-voltage (IEL-V) curve, and the EL spectra ... | Poly(p-di ethynylene phenylene); PPV; Pi-conjugated polymers | 1995 |
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