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| Title | Date | Type | ||
|---|---|---|---|---|
| 1 |
 | A gallium arsenide mutual exclusion element | 1993 | Text |
| 2 |
 | A partial scan methodology for testing self-timed circuits | 1995 | Text |
| 3 |
 | An algebraic formulation of seitz's weak conditions for self timed circuits | 1982 | Text |
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