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1996
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1999
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"Scanning capacitance microscope"
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Title
Date
Type
1
Advances in experimental technique for quantitative two dimensional dopant profiling by scanning capacitance microscopy
1999
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2
Evidence for internal electric fields in two variant ordered GaInP obtained by scanning capacitance microscopy
1996
Text
3
Scanning capacitance microscope methodology for quantitative analysis of P-N junctions
1999
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