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 | Williams, Clayton C. | Evidence of internal electric fields in GaInP2 by scanning capacitance and near-field scanning optical microscopy | GaInP2 is studied in cross section with the scanning capacitance and near-field scanning optical microscope. Our study shows significant differences in the electronic and optical properties between ordered single- and two-variant GaInP2. In single-variant samples, spatially uniform capacitance signa... | Atomic ordering; transmission electron diffraction; near-field scanning optical microscope | 1997 |