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| Creator | Title | Description | Subject | Date | ||
|---|---|---|---|---|---|---|
| 1 |
 | Williams, Clayton C. | Electron tunneling detected by electrostatic force | A method is introduced for measuring the tunneling of electrons between a specially fabricated scanning probe microscope tip and a surface. The technique is based upon electrostatic force detection of charge as it is transferred to and from a small (10217 F) electrically isolated metallic dot on the... | Electrons; Tunneling events; Electrostatic force microscopy | 2000 |
| 2 |
 | Williams, Clayton C. | Single electron tunneling detected by electrostatic force | Single electron tunneling events between a specially fabricated scanning probe and a conducting surface are demonstrated. The probe is an oxidized silicon atomic force microscope tip with an electrically isolated metallic dot at its apex. A voltage applied to the silicon tip produces an electrostat... | Single electron; Tunneling events; Scanning tunneling microscope; Electrostatic modeling | 2001 |
| 3 |
 | Williams, Clayton C. | Single electron tunneling to insulator surfaces detected by electrostatic force | The detection of single-electron tunneling events between a metallic scanning probe tip and an insulating surface is demonstrated by an electrostatic force method. When a voltage-biased oscillating atomic force microscopy tip is placed within tunneling range of the surface of an insulator, single... | Single electron; Tunneling events; Scanning tunneling microscope | 2002 |
| 4 |
 | Williams, Clayton C. | Single electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy | Single-electron tunneling events between a metal probe and an insulator surface are measured by frequency detection electrostatic force microscopy. Single-electron tunneling events typically cause 1-10 Hz shifts in the 300 kHz resonance frequency of the oscillating force probe. The frequency shift... | Electrons; Tunneling events; Electrostatic force microscopy | 2004 |
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