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| Creator | Title | Description | Subject | Date | ||
|---|---|---|---|---|---|---|
| 1 |
 | Balasubramonian, Rajeev | Exploiting eager register release in a redundantly multi-threaded processor | Due to shrinking transistor sizes and lower supply voltages, transient faults (soft errors) in computer systems are projected to increase by orders of magnitude. Fault detection and recovery can be achieved through redundancy. Redundant multithreading (RMT) is one attractive approach to detect and r... | Transient faults; Soft errors; Redundant multithreading; Eager register release; Register file design | 2006 |
| 2 |
 | Balasubramonian, Rajeev | First-order analysis of power overheads of redundant multi-threading | Redundant multi-threading (RMT) has been proposed as an architectural approach that efficiently detects and recovers from soft errors. RMT can impose non-trivial overheads in terms of power consumption. In this paper, we characterize some of the major factors that influence the power consumed by R... | Redundant multi-threading; RMT; Soft errors; Power overheads; Power consumption | 2006 |
| 3 |
 | Balasubramonian, Rajeev | Leveraging 3D technology for improved reliability | Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower supply voltages have increased the vulnerability of computer systems towards transient faults. An increase in within-die an... | Reliability; Redundant multi-threading, 3D die-stacking; Parameter variation; Soft errors; Dynamic timing errors; Power-efficient microarchitecture; On-chip temperature | 2007-12 |
| 4 |
 | Balasubramonian, Rajeev | Power efficient approaches to redundant multithreading | Noise and radiation-induced soft errors (transient faults) in computer systems have increased significantly over the last few years and are expected to increase even more as we move toward smaller transistor sizes and lower supply voltages. Fault detection and recovery can be achieved through redund... | Reliability; Power; Transient faults; Soft errors; Redundant multithreading (RMT); Heterogeneous chip multiprocessors dynamic frequency scaling | 2007-08 |
| 5 |
 | Balasubramonian, Rajeev | Power-efficient approaches to reliability | Radiation-induced soft errors (transient faults) in computer systems have increased significantly over the last few years and are expected to increase even more as we move towards smaller transistor sizes and lower supply voltages. Fault detection and recovery can be achieved through redundancy. St... | Radiation-induced; Soft errors; Transient faults; Redundant thread; Trailing thread; Power consumption | 2005 |
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