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| Creator | Title | Description | Subject | Date | ||
|---|---|---|---|---|---|---|
| 1 |
 | Michell, Nick | A gallium arsenide mutual exclusion element | A mutual exclusion element is a key component in building asynchronous and self-timed circuits. As part of our effort to design high performance self-timed circuits, we have designed a mutual exclusion element in gallium arsenide. This circuit has been fabricated in a 1.2? process and tested. A test... | Mutual exclusion element; Self-timed circuits | 1993 |
| 2 |
 | Brunvand, Erik L. | A partial scan methodology for testing self-timed circuits | This paper presents a partial scan method for testing control sections of macromodule based self-timed circuits for stuck-at faults. In comparison with other proposed test methods for self-timed circuits, this technique offers better fault coverage than methods using self-checking techniques, and re... | Self-timed circuits; Testing | 1995 |
| 3 |
 | Subrahmanyam, P.A. | An algebraic formulation of seitz's weak conditions for self timed circuits | Two fairly intuitive conditions are given that serve to algebraically characterize Seitz's "weak conditions" for self timed circuits. It is shown that these two conditions embody the 12 temporal logic conditions (developed b y Owicki and Malachi) which are intended to express both the weak condition... | Seitz's weak conditions; Self-timed circuits | 1982 |
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