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| Creator | Title | Description | Subject | Date | ||
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 | Balasubramonian, Rajeev | Power-efficient approaches to reliability | Radiation-induced soft errors (transient faults) in computer systems have increased significantly over the last few years and are expected to increase even more as we move towards smaller transistor sizes and lower supply voltages. Fault detection and recovery can be achieved through redundancy. St... | Radiation-induced; Soft errors; Transient faults; Redundant thread; Trailing thread; Power consumption | 2005 |
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