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CreatorTitleDescriptionSubjectDate
1 Armentrout, Peter B.Dissociative charge transfer reactions of Ar+, Ne+, and He+ with CF4 from thermal to 50 eVGuided ion-beam techniques are used to measure the cross sections for reaction of CF4 with Ar+, Ne+, and H e + from thermal to 50 eV. Dissociative charge transfer followed by successive loss of F atoms are the major processes observed. Only CFx+ (x = 1,2,3) products are observed in the reactions of ...Ion-molecule reactions; Transfer reactions; Carbon tetrafluoride; Rare gas ions; Exothermic reactions; Endothermic reactions; Plasma systems1990
2 Armentrout, Peter B.Kinetic energy dependence of dissociative charge-transfer reactions of He+, Ne+, Ar+, Kr+, and Xe+ with silaneGuided ion-beam techniques are used to measure the cross sections as a function of kinetic energy for reaction of SiH4 with He +, Ne +, Ar +, Kr +, and Xe +. State-specific data for the 2P3/2 ground spin-orbit states of Kr+ and Xe+ are also obtained.Silane; Charge-transfer reactions; Ion-molecule reactions; Ion energy; Rare gas ions; Plasma systems1990
3 Armentrout, Peter B.Reactions of Ar+, Ne+, and He+ with SiF4 from thermal energy to 50 eV c.m.Guided ion-beam techniques are used to measure the cross sections for reaction of SiF4 with Ar+, Ne+, and He+ from thermal to 50 eV. Charge transfer followed by loss of F atoms are the sole processes observed. All SiFx + (x = 0-4) products are observed, except for SiF4 + from reaction with Ne+ and ...Ion-molecule reactions; Tetrafluorosilane; Rare gas ions; Endothermic reactions; Plasma systems1989
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