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Filters: Format: "application/pdf" Collection: "ir_uspace" Subject: "Electrostatic force microscopy"
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| Creator | Title | Description | Subject | Date | ||
|---|---|---|---|---|---|---|
| 1 |
 | Williams, Clayton C. | Electron tunneling detected by electrostatic force | A method is introduced for measuring the tunneling of electrons between a specially fabricated scanning probe microscope tip and a surface. The technique is based upon electrostatic force detection of charge as it is transferred to and from a small (10217 F) electrically isolated metallic dot on the... | Electrons; Tunneling events; Electrostatic force microscopy | 2000 |
| 2 |
 | Williams, Clayton C. | Instability induced tunneling and repeatable charge injection to SiO2 surfaces by electrostatic force microscopy | The dynamic response and stability of a voltage biased oscillating cantilever in the proximity of an insulating sample surface is investigated. As the tip approaches the sample surface, the cantilever can jump between two different oscillation modes. The jump is detected as an abrupt increase in t... | Electrostatic force microscopy; EFM; Dielectric films | 2004 |
| 3 |
 | Williams, Clayton C. | Single electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy | Single-electron tunneling events between a metal probe and an insulator surface are measured by frequency detection electrostatic force microscopy. Single-electron tunneling events typically cause 1-10 Hz shifts in the 300 kHz resonance frequency of the oscillating force probe. The frequency shift... | Electrons; Tunneling events; Electrostatic force microscopy | 2004 |
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