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| Creator | Title | Description | Subject | Date | ||
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| 1 |
 | Williams, Clayton C. | Instability induced tunneling and repeatable charge injection to SiO2 surfaces by electrostatic force microscopy | The dynamic response and stability of a voltage biased oscillating cantilever in the proximity of an insulating sample surface is investigated. As the tip approaches the sample surface, the cantilever can jump between two different oscillation modes. The jump is detected as an abrupt increase in t... | Electrostatic force microscopy; EFM; Dielectric films | 2004 |
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