UScholar Works
 
Filters: Format: "application/pdf" Journal Title: "Review of Scientific Instruments" Collection: "ir_uspace"
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CreatorTitleDescriptionSubjectDate
1 Whitty, Kevin J.A system for measuring bubble voidage and frequency around tubes immersed in a fluidized bed of particlesGas-solid fluidized beds are common in chemical processing and energy production industries. These types of reactors frequently have banks of tubes immersed within the bed to provide heating or cooling, and it is important that the fluid dynamics within these bundles is efficient and uniform. This p...2010
2 Symko, Orest GeorgeCalibration of SQUID magnetometer for dilute alloy studiesA SQUID magnetometer used in the study of dilute magnetic alloys or other weak magnetic systems can be calibrated by using the nuclear paramagnetism of aluminum metal. This material is useful as a calibration standard since magnetic impurities such as Fe and Mn form no local moment. This calibration...SQUID magnetometer1979
3 Symko, Orest GeorgeContinuously operating 4He evaporation refrigeratorA simple and compact device was developed to provide continuous, self-regulating refrigeration at approximately 1.3 K. The temperature of the device remains nearly constant, independent of external power, up to a critical power. For a molar flow rate of 10^-4 moles/sec, the refrigerator can absorb...4He evaporation refrigerator1971
4 Vardeny, Zeev ValentineDouble-modulation electro-optic sampling for pump-and-probe ultrafast correlation measurementsWe describe a novel electro-optic double-modulation (DM) sampling technique for ultrafast transient spectroscopy, which is characterized by a superior signal-to-noise ratio compared to that of a regular single-modulation technique. DM is achieved by a combined effect of a radio-frequency modulation,...Double-modulation; Electro-optic sampling; Ultrafast transient spectroscopy; Pump; Probe1998
5 Rieth, Loren W; Solzbacher, FlorianHigh speed wafer scale bulge testing for the determination of thin film mechanical propertiesA wafer scale bulge testing system has been constructed to study the mechanical properties of thin films and microstructures. The custom built test stage was coupled with a pressure regulation system and optical profilometer which gives high accuracy three-dimensional topographic images collected on...2010
6 Saam, BrianProtection circuitry for high-power diode laser arraysA comprehensive protection scheme is presented for use with high-power (;500 W dc input! diode laser arrays. The circuitry requires no separate power, using instead the voltage from the laser's power supply. Overcurrent and overvoltage silicon controlled rectifier crowbars are the primary protection...Protection circuitry; High-power diode laser arrays1998
7 Williams, Clayton C.Sub-10 nm lateral spatial resolution in scanning capacitance microscopy achieved with solid platinum probesSub-10 nm resolution can be obtained in scanning capacitance microscopy (SCM) if the probe tip is approximately of the same size. Such resolution is observed, although infrequently, with present commercially available probes. To acquire routine sub-10 nm resolution, a solid Pt metal probe has bee...2004
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