UScholar Works
 
Filters: Format Medium: "application/pdf" Subject: "Oxide layer" Type: "Text"
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TitleDateType
1 Direct comparison of cross-sectional scanning capacitance microscope dopant profile and vertical secondary ion-mass spectroscopy profile1996-01Text
2 Direct imaging of SiO2 thickness variation on Si using modified atomic force microscope1996-03-01Text
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