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| Creator | Title | Description | Subject | Date | ||
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 | Armentrout, Peter B. | Reactions of Ar+, Ne+, and He+ with SiF4 from thermal energy to 50 eV c.m. | Guided ion-beam techniques are used to measure the cross sections for reaction of SiF4 with Ar+, Ne+, and He+ from thermal to 50 eV. Charge transfer followed by loss of F atoms are the sole processes observed. All SiFx + (x = 0-4) products are observed, except for SiF4 + from reaction with Ne+ and ... | Ion-molecule reactions; Tetrafluorosilane; Rare gas ions; Endothermic reactions; Plasma systems | 1989 |
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