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| Creator | Title | Description | Subject | Date | ||
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 | Williams, Clayton C. | Measurement of in-plane magnetization by force microscopy | We present data which show that the magnetic force microscope is capable of detecting the component of the magnetic field parallel to the surface of a sample under study. Images of bits in a Co-alloy thin-film disk and of laser-written bits in a TbFe film were taken with a magnetized tip tilted at ... | Co-alloy disc; Magnetization | 1988 |
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