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TitleDateType
1Absorption studies of charged excitations in α-sexithiophene1996Text
2Evidence for internal electric fields in two variant ordered GaInP obtained by scanning capacitance microscopy1996Text
3Nanometer scale absorption spectroscopy by near-field photodetection optical microscopy1996Text
4New mapping for particles on lattices with hard-core interactions1996Text
5Optically detected magnetic resonance studies of undoped a-Si:H1996Text
6Photoexcitation dynamics in C60-doped PPV under bias illumination1996Text
7Absorption-detected magnetic-resonance studies of photoexcitations in conjugated-polymer/C60 composites1996-02Text
8Continuum limit in the quenched approximation1996-03Text
9Direct comparison of cross-sectional scanning capacitance microscope dopant profile and vertical secondary ion-mass spectroscopy profile1996-01Text
10Electronic Raman scattering in a magnetic field1996-01Text
11fB quenched and unquenched1996-03Text
12Hidden massive Dirac fermions in effective field theory for integral quantum Hall transitions1996-08Text
13Mutual exclusion statistics between quasiparticles in the fractional quantum Hall effect1996-10Text
14Mutual-exclusion statistics in exactly solvable models in one and higher dimensions at low temperatures1996-08Text
15Nt = 6 equation of state for two flavor QCD1996-03Text
16Optically-detected magnetic-resonance study of triplet state dynamics in C701996-03Text
17Quantum group, Bethe ansatz equations, and Bloch wave functions in magnetic fields1996-04Text
18Singlet s-wave scattering lengths of 6Li and 7Li1996-06Text
19Studies of charged excitations in ∏-conjugated oligomers and polymers by optical modulation1996-08Text
20Two-dimensional scanning capacitance microscopy measurements of cross-sectioned very large scale integration test structures1996-01Text
21Two-flavor staggered fermion thermodynamics at Nt = 121996-10Text
22Direct imaging of SiO2 thickness variation on Si using modified atomic force microscope1996-03-01Text
23Spatial mapping of ordered and disordered domains of GaInP by near-field scanning optical microscopy and scanning capacitance microscopy1996-04-13Text
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