76 - 100 of 577
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TitleSetnameType
76 An efficient algorithm for joint estimation of differential time delays and frequency offsetsir_uspaceText
77 An efficient algorithm for lattice filter/predictorir_uspaceText
78 An efficient stochastic approach to uncertainty quantification in 3-D FDTD magnetized cold plasmair_uspaceText
79 An exothermal energy release layer for microchip transienceir_uspaceText
80 An improvement in partial order reduction using behavioral analysisir_uspaceText
81 An optimal design procedure for intraband vector quantized subband codingir_uspaceText
82 Analog decoding of product codesir_uspaceText
83 Analog decoding of product codesir_uspaceText
84 Analog decoding of product codesir_uspaceText
85 Analog decoding of product codesir_uspaceText
86 Analog MAP decoder for (8, 4) hamming code in subthreshold CMOSir_uspaceText
87 Analog MAP decoder for (8, 4) hamming code in subthreshold CMOSir_uspaceText
88 Analog MAP decoder for (8,4) hamming code in subthreshold CMOSir_uspaceText
89 Analog VLSI implementation of a visual interneuron: enhanced sensory processing through biophysical modelingir_uspaceText
90 Analog VLSI model of the fly elementary motion detectorir_uspaceText
91 Analysis of electromagnetic field variability in magnetized ionosphere plasma using the stochastic FDTD methodir_uspaceText
92 Analysis of spread spectrum time domain reflectometry for wire fault locationir_uspaceText
93 Analysis of the short-time unbiased spectrum estimation algorithmir_uspaceText
94 Anisotropic diffusion of surface normals for feature preserving surface reconstructionir_uspaceText
95 Anisotropic diffusion of surface normals for feature preserving surface reconstructionir_uspaceText
96 Antenna optimization for vehicular environmentsir_uspaceText
97 Application of phase detection frequency domain reflectometry for locating faults in an F-18 flight control harnessir_uspaceText
98 Architectural synthesis of timed asynchronous systemsir_uspaceText
99 Atomic force microscopy study of ordered GaInPir_uspaceText
100 Atomic ordering of GaInP studied by Kelvin probe force microscopyir_uspaceText
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