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| Title | Date | Type | ||
|---|---|---|---|---|
| 1 |
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A partial scan methodology for testing self-timed circuits | 1995 | Text |
| 2 |
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Linguistic support for unit testing | 2007 | Text |
| 3 |
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Testing two-phase transition signaling based self-timed circuits in a synthesis environment | 1993 | Text |
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