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1 Normann, Richard A.; Abbasi, Masoud; Johansson,TorbjornSilicon carbide enhanced thermomigrationThe widespread acceptance of thermomigration technology to produce through-chip interconnects has been impaired by (i) a random walk of the Si-Al liquid eutectic inclusion as it traverses the wafer, and (ii) a ?surface barrier? which allows thermomigration of only relatively large inclusions. In ...Silicon Dioxide; Thermometers; Transducers; Thermomigration Technology; Infrared Lamps1992
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