Creator | Title | Description | Subject | Date | ||
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1 | Normann, Richard A.; Abbasi, Masoud; Johansson,Torbjorn | Silicon carbide enhanced thermomigration | The widespread acceptance of thermomigration technology to produce through-chip interconnects has been impaired by (i) a random walk of the Si-Al liquid eutectic inclusion as it traverses the wafer, and (ii) a ?surface barrier? which allows thermomigration of only relatively large inclusions. In ... | Silicon Dioxide; Thermometers; Transducers; Thermomigration Technology; Infrared Lamps | 1992 |