Filters: Collection: "ir_uspace" Subject: "AFM"
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| Creator | Title | Description | Subject | Date | ||
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Williams, Clayton C. | Shear force microscopy with capacitance detection for near-field scanning optical microscopy | Shear force microscopy is very useful for distance regulation in near-field scanning optical microscopy (NSOM). However, the optical method used to detect the shear force can cause problems when imaging photosensitive materials, i.e., the shear force detection beam can optically pump the sample. We ... | Shear force microscopy; Atom force microscope; AFM; Capacitance sensing | 1995 |
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