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| Creator | Title | Description | Subject | Date | ||
|---|---|---|---|---|---|---|
| 1 |
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Brunvand, Erik L. | A partial scan methodology for testing self-timed circuits | This paper presents a partial scan method for testing control sections of macromodule based self-timed circuits for stuck-at faults. In comparison with other proposed test methods for self-timed circuits, this technique offers better fault coverage than methods using self-checking techniques, and re... | Self-timed circuits; Testing | 1995 |
| 2 |
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Gray, Kathryn E. | Linguistic support for unit testing | Existing systems for writing unit tests exploit built-in language constructs, such as reflection, to simulate the addition of testing constructs. While these simulations provide the minimally necessary functionality, they fail to support testing properly in many instances. In response, we have ... | Java; Testing; Unit testing | 2007 |
| 3 |
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Akella, Venkatesh | Testing two-phase transition signaling based self-timed circuits in a synthesis environment | The problem of testing self-timed circuits generated by an automatic synthesis system is studied. Two-phase transition signalling is assumed and the circuits are targetted for an asynchronous macromodule based implementation as in [?, ?, ?, ?]. The partitioning of the circuits into control blocks, ... | Testing; two-phase; transition signaling; self-timed circuits | 1993 |
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