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| Creator | Title | Description | Subject | Date | ||
|---|---|---|---|---|---|---|
| 1 |
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Williams, Clayton C. | Single electron tunneling detected by electrostatic force | Single electron tunneling events between a specially fabricated scanning probe and a conducting surface are demonstrated. The probe is an oxidized silicon atomic force microscope tip with an electrically isolated metallic dot at its apex. A voltage applied to the silicon tip produces an electrostat... | Single electron; Tunneling events; Scanning tunneling microscope; Electrostatic modeling | 2001 |
| 2 |
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Williams, Clayton C. | Single electron tunneling force spectroscopy of an individual electronic state in a non-conducting surface | A tunneling spectroscopy technique to measure the energy level of an electronic state in a completely nonconducting surface is demonstrated. Spectroscopy is performed by electrostatic force detection of single-electron tunneling between a scanning probe and the state as a function of an applied vo... | Tunneling; Spectroscopy; Single electron; Scanning tunneling microscope | 2006 |
| 3 |
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Williams, Clayton C. | Single electron tunneling to insulator surfaces detected by electrostatic force | The detection of single-electron tunneling events between a metallic scanning probe tip and an insulating surface is demonstrated by an electrostatic force method. When a voltage-biased oscillating atomic force microscopy tip is placed within tunneling range of the surface of an insulator, single... | Single electron; Tunneling events; Scanning tunneling microscope | 2002 |
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