Filters: Format: "application/pdf" School Or College: "College of Engineering" Collection: "ir_uspace" Subject: "Atomic force microscopy"
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| Creator | Title | Description | Subject | Date | ||
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Stringfellow, Gerald B. | Effect of growth rate on step structure and ordering in GaInP | CuPt ordering is widely observed in GaInP epitaxial layers grown by organometallic vapor phase epitaxy. The formation of this spontaneously ordered structure during epitaxial growth is intimately related to the atomic-scale physical processes occurring on the surface, specifically surface reconst... | Atomic force microscopy; Organometallic vapor phase; Crystallographic plane | 1997 |
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Scarpulla, Michael | New methodologies for measuring film thickness, coverage, and topography | We describe how the techniques of X-ray reflectivity (XRR), electron spectroscopy for chemical analysis (ESCA), and atomic force microscopy (AFM) can be used to obtain the structural parameters-thickness, coverage, and topography-of thin films used on magnetic recording disks. We focus on ultra-thi... | Atomic force microscopy; Electron spectroscopy for chemical analysis; X-ray reflectivity | 2000-01 |
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