Publication Type |
pre-print |
School or College |
<blank> |
Department |
<blank> |
Creator |
Gerig, Guido |
Other Author |
Styner, Martin; Oguz, Ipek; Heimann, Tobias |
Title |
Minimum description length with local geometry |
Date |
2008-01-01 |
Description |
Establishing optimal correspondence across object populations is essential to statistical shape analysis. Minimizing the description length (MDL) is a popular method for finding correspondence. In this work, we extend the MDL method by incorporating various local curvature metrics. Using local curvature can improve performance by ensuring that corresponding points exhibit similar local geometric characteristics that can't always be captured by mere point locations. We illustrate results on a variety of anatomical structures. The MDL method with a combination of point locations and curvature outperforms all the other methods we analyzed, including traditional MDL and spherical harmonics (SPHARM) correspondence, when the analyzed object population exhibits complex structure. When the objects are of simple nature, however, there's no added benefit to using the local curvature. In our experiments, we did not observe a significant difference in the correspondence quality when different curvature metrics (e.g. principal curvatures, mean curvature, Gaussian curvature) were used. |
Type |
Text |
Publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
First Page |
1283 |
Last Page |
1286 |
Language |
eng |
Bibliographic Citation |
Styner, M., Oguz, I., Heimann, T., & Gerig, G. (2008). Minimum description length with local geometry. Proceedings of the 5th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 1283-6. |
Rights Management |
(c) 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Format Medium |
application/pdf |
Format Extent |
220,645 bytes |
Identifier |
uspace,19239 |
ARK |
ark:/87278/s61z7dj8 |
Setname |
ir_uspace |
ID |
712796 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s61z7dj8 |