Random testing of interrupt-driven software

Update Item Information
Publication Type Manuscript
School or College College of Engineering
Department Computing, School of
Creator Regehr, John
Title Random testing of interrupt-driven software
Date 2005-01-01
Description Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using random interrupt testing-firing random interrupt handlers at random times. Unfortunately, na¨ıve application of random testing to interrupt-driven software does not work: some randomly generated interrupt schedules violate system semantics, causing spurious failures. The contribution of this paper is the design, implementation, and experimental evaluation of RID, a restricted interrupt discipline that hardens embedded software with respect to unexpected interrupts, making it possible to perform random interrupt testing and also protecting it from spurious interrupts after deployment. We evaluate RID by implementing it in TinyOS and then using random interrupt testing to find bugs and also to drive applications toward their worst-case stack depths.
Type Text
Publisher Association for Computing Machinery
First Page 290
Last Page 298
DOI http://doi.acm.org/10.1145/nnnnnn.nnnnnn ; Doi 10.1145/1086228.1086282.
Dissertation Institution University of Utah
Language eng
Bibliographic Citation Regehr, J. (2005). Random testing of interrupt-driven software. In Proceedings of the ACM Conference on Embedded Software (EMSOFT), 290-8. September.
Rights Management © ACM, 2005. This is the authors version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in Proceedings of the ACM Conference on Embedded Software (EMSOFT), 290-8. September.
Format Medium application/pdf
Format Extent 814,409 bytes
Identifier uspace,17491
ARK ark:/87278/s6c82v2p
Setname ir_uspace
ID 707981
Reference URL https://collections.lib.utah.edu/ark:/87278/s6c82v2p
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