Publication Type |
Journal Article |
School or College |
College of Engineering |
Department |
Materials Science & Engineering |
Creator |
Scarpulla, Michael |
Other Author |
Nowell, M. M.; Compaan, A. D.; Liu, X.; Paudel, N. R.; Kwon, Dohyoung; Wieland, K. A. |
Title |
Electron backscatter diffraction and photoluminescence of sputtered CdTe thin films |
Date |
2011-01-01 |
Description |
Electron backscatter diffraction (EBSD) has been used to characterize the grain size, grain boundary structure, and texture of sputtered CdTe at varying deposition pressures before and after CdCl2 treatment in order to correlate performance with film microstructure. It is known that twin boundaries may have different electrical properties than high-angle grain boundaries and in this work we have included the effects of twin boundaries. We found better correlation of solar cell device performance to the twin-corrected grain size than to the standard grain size. In addition, we have correlated the photoluminescence (PL) spectra with device performance and with the EBSD results. We find that sputtering at 18 mTorr yields the highest efficiency, largest twin-corrected grain size and the strongest PL. |
Type |
Text |
Publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
Issue |
001327 |
First Page |
001332 |
Dissertation Institution |
University of Utah |
Language |
eng |
Bibliographic Citation |
Nowell, M. M., Scarpulla, M. A., Compaan, A. D., Liu, X., Paudel, N. R., Kwon, D., & Wieland, K. A. (2011). Electron backscatter diffraction and photoluminescence of sputtered CdTe thin films. Conference record of the 37th IEEE Photovoltaic Specialists Conference, 001327-32. |
Rights Management |
(c) 2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Format Medium |
application/pdf |
Format Extent |
327,232 bytes |
Identifier |
uspace,17098 |
ARK |
ark:/87278/s6jh44v1 |
Setname |
ir_uspace |
ID |
707703 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6jh44v1 |