| Publication Type |
Journal Article |
| School or College |
College of Science |
| Department |
Physics |
| Creator |
Symko, Orest George |
| Other Author |
Klein, T. |
| Title |
Does the quasicrystal AlCuFe follow Ohm's law? |
| Date |
1994-10 |
| Description |
We present the first measurements of the electrical I-V characteristics of AlCuFe quasicrystalline thin films processed by solid state interdiffusion of magnetron sputtered Al, Cu, and Fe layers. Despite the peculiar electronic properties of quasicrystals, our results show that those samples follow perfectly Ohm's law for bias voltages which vary by 7 orders of magnitude. |
| Type |
Text |
| Publisher |
American Physical Society |
| Journal Title |
Physical Review Letters |
| Volume |
73 |
| Issue |
16 |
| First Page |
2248 |
| Last Page |
2251 |
| DOI |
10.1103/PhysRevLett.73.2248 |
| citatation_issn |
0031-9007 |
| Subject |
AlCuFe; Quasicrystal |
| Subject LCSH |
Ohm's law; Thin films -- Electric properties; Quasicrystals -- Electric properties |
| Language |
eng |
| Bibliographic Citation |
Klein, T., & Symko, O. G. (1994). Does the quasicrystal AlCuFe follow Ohm's law? Physical Review Letters, 73(16), 2248-51. |
| Rights Management |
(c) American Physical Society http://dx.doi.org/10.1103/PhysRevLett.73.2248 |
| Format Medium |
application/pdf |
| Format Extent |
410,517 bytes |
| Identifier |
ir-main,11113 |
| ARK |
ark:/87278/s6bv819q |
| Setname |
ir_uspace |
| ID |
707314 |
| Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6bv819q |
