| Publication Type |
Journal Article |
| School or College |
College of Engineering |
| Department |
Electrical & Computer Engineering |
| Creator |
Stevens, Kenneth |
| Other Author |
Liu, Ying; Aldwinckle, John; Birtwistle, Graham |
| Title |
Testing the consequences of specifications in modal µ |
| Date |
1993 |
| Description |
In a companion paper in these proceedings [6], we introduced the CCS notation and explained how to write specifications succinctly in CCS using the composition operator. In this paper we explain how one may associate a process logic with CCS and use it to resolve deadlock, safety, liveness, and fairness properties of specifications by static testing. |
| Type |
Text |
| Publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
| First Page |
987 |
| Last Page |
990 |
| Language |
eng |
| Bibliographic Citation |
Liu, Y., Aldwinckle, J., Birtwistle, G., & Stevens, K. S. (1993). Testing the consequences of specifications in modal µ. Canadian Conference on Electrical and Computer Engineering, 987-90. September. |
| Rights Management |
(c) 1993 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
| Format Medium |
application/pdf |
| Format Extent |
314,032 bytes |
| Identifier |
ir-main,15314 |
| ARK |
ark:/87278/s6697mxp |
| Setname |
ir_uspace |
| ID |
704790 |
| Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6697mxp |
