Picosecond trapping of photocarriers in amorphous silicon

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Publication Type Journal Article
School or College College of Science
Department Physics
Creator Vardeny, Zeev Valentine
Other Author Strait, J.; Tauc, J.
Title Picosecond trapping of photocarriers in amorphous silicon
Date 1983
Description Trapping of photoexcited carriers in the picosecond and subnanosecond time domains was studied by measuring the decay of photoinduced absorption (PA) in a-Si, a-Si:F, a-Si:H, and a-Si:H:F. We found that when the midgap density of states decreases, both the trapping time and its temperature dependence increase. The observed PA decays are compared to the picosecond photoconductivity decays, and the differences in the response curves are explained. The possibility that geminate recombination might explain our results is ruled out.
Type Text
Publisher American Institute of Physics (AIP)
Volume 42
Issue 7
First Page 580
Last Page 582
DOI 10.1063/1.94008
Subject Photocarriers; Amorphous silicon; Picosecond trapping; Photoinduced absorption
Subject LCSH Picosecond pulses; Amorphous semiconductors
Language eng
Bibliographic Citation Vardeny, Z, Strait, J., & Tauc, J. (1983). Picosecond trapping of photocarriers in amorphous silicon. Applied Physics Letters, 42(7), 580-2.
Rights Management ©American Institute of Physics. The following article appeared in Vardeny, Z, Strait, J., & Tauc, J., Applied Physics Letters, 42(7), 1983 and may be found at http://dx.doi.org/10.1063/1.94008
Format Medium application/pdf
Format Extent 325,774 bytes
Identifier ir-main,9567
ARK ark:/87278/s60k2svv
Setname ir_uspace
ID 704251
Reference URL https://collections.lib.utah.edu/ark:/87278/s60k2svv
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