Observation of a narrow pseudogap near the Fermi level of AlCuFe quasicrystalline thin films

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Publication Type Journal Article
School or College College of Science
Department Physics
Creator Symko, Orest George
Other Author Klein, T.; Davydov, D. N.; Jansen, A. G. M.
Title Observation of a narrow pseudogap near the Fermi level of AlCuFe quasicrystalline thin films
Date 1995-05
Description We present the first experimental determination by tunneling spectroscopy of the density of states (DOS) close to the Fermi energy of AlCuFe quasicrystalline thin film samples. The measurements show that the Fermi level in a quasicrystal lies in a deep narrow pseudogap 60 m e V wide. Above an applied voltage of 50 m V a Vl / 2 contribution to the DOS is observed in agreement with electron-electron interaction effects.
Type Text
Publisher American Physical Society
Journal Title Physical Review Letters
Volume 74
Issue 18
First Page 3656
Last Page 3659
DOI 10.1103/PhysRevLett.74.3656
citatation_issn 0031-9007
Subject AlCuFe; Quasicrystalline thin films; Pseudogap; Fermi level; Density of states; DOS
Subject LCSH Electric conductivity; Thin films -- Electric properties
Language eng
Bibliographic Citation Klein, T., Symko, O. G., Davydov, D. N., & Jansen, A. G. M. (1995). Observation of a narrow pseudogap near the Fermi level of AlCuFe quasicrystalline thin films. Physical Review Letters, 74(18), 3656-9.
Rights Management (c) American Physical Society http://dx.doi.org/10.1103/PhysRevLett.74.3656
Format Medium application/pdf
Format Extent 347,559 bytes
Identifier ir-main,11112
ARK ark:/87278/s6k36bsj
Setname ir_uspace
ID 702768
Reference URL https://collections.lib.utah.edu/ark:/87278/s6k36bsj
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