| Publication Type |
journal article |
| School or College |
College of Engineering |
| Department |
Materials Science & Engineering |
| Creator |
Liu, Feng |
| Other Author |
Jaloviar, S. G.; Lin, Jia-Ling; Zielasek, V.; McCaugham, L.; Lagally, M. G. |
| Title |
Step-induced optical anisotropy of vicinal Si(001) |
| Date |
1999-01 |
| Description |
It is demonstrated, using reflectance difference spectroscopy, scanning tunneling microscopy, and low-energy electron diffraction, combined with deliberate straining of the surface, that the presence of atomic steps dramatically changes the optical anisotropy of the Si(001) surface. The step-induced reflectance difference signal originates predominately from rebonded steps and is comparable in magnitude to that of the terrace signal. |
| Type |
Text |
| Publisher |
American Physical Society |
| Journal Title |
Physical Review Letters |
| Volume |
82 |
| Issue |
4 |
| First Page |
791 |
| Last Page |
794 |
| DOI |
10.1103/PhysRevLett.82.791 |
| citatation_issn |
0031-9007 |
| Subject |
Step-induced; Optical anisotropy; Vicinal Si(001); Electron diffraction; Atomic steps |
| Subject LCSH |
Anisotropy; Reflectance spectroscopy; Scanning tunneling microscopy; Strain theory (Chemistry) |
| Language |
eng |
| Bibliographic Citation |
Jaloviar, S. G., Lin, J.-L., Liu, F., Zielasek, V., McCaugham, L., & Lagally, M. G. (1999). Step-induced optical anisotropy of vicinal Si(001). Physical Review Letters, 82(4), 791-4. |
| Rights Management |
© American Physical Society http://dx.doi.org/10.1103/PhysRevLett.82.791 |
| Format Medium |
application/pdf |
| Format Extent |
211,622 bytes |
| Identifier |
ir-main,12202 |
| ARK |
ark:/87278/s6gx4vwp |
| Setname |
ir_uspace |
| ID |
704751 |
| Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6gx4vwp |
