| Publication Type | pre-print |
| School or College | College of Engineering |
| Department | Mechanical Engineering |
| Creator | Roundy, Shadrach J. |
| Other Author | Bryzek, Janusz |
| Title | MEMS testing: transition from millions to billions to trillions |
| Date | 2012-01-01 |
| Description | Sensors, specifically MEMSbased, have created multiple market tornados over the past 40 years. Most recently there has been a market explosion driven by the widespread adoption of MEMS sensing devices in mobile consumer applications. In the past 5 years the worldwide market has grown from roughly 10 million to 3 billion sensors in mobile devices, representing a growth rate of over 200%/ year. The total market is expected to grow to at least 16 billion sensors in the next 5 years, and a trillion sensors in 10 years. |
| Type | Text |
| Publisher | Chip Scale Review Magazine |
| First Page | 1 |
| Last Page | 3 |
| Language | eng |
| Bibliographic Citation | Bryzek, J., & Roundy, S. J. (2012). MEMS testing: transition from millions to billions to trillions. Chip Scale Review, 1-3 |
| Rights Management | © Chip Scale Review Magazine |
| Format Medium | application/pdf |
| Format Extent | 497,307 bytes |
| Identifier | uspace,18278 |
| ARK | ark:/87278/s6bg36v8 |
| Setname | ir_uspace |
| ID | 708823 |
| Reference URL | https://collections.lib.utah.edu/ark:/87278/s6bg36v8 |