| Publication Type |
journal article |
| School or College |
College of Science |
| Department |
Physics |
| Creator |
Williams, Clayton C. |
| Other Author |
Klein, L. J.; Kim, J. |
| Title |
Electron tunneling detected by electrostatic force |
| Date |
2000 |
| Description |
A method is introduced for measuring the tunneling of electrons between a specially fabricated scanning probe microscope tip and a surface. The technique is based upon electrostatic force detection of charge as it is transferred to and from a small (10217 F) electrically isolated metallic dot on the scanning probe tip. The methods for dot fabrication, charging, and discharging are described and electron tunneling to a sample surface is demonstrated. |
| Type |
Text |
| Publisher |
American Institute of Physics (AIP) |
| Volume |
77 |
| First Page |
3615 |
| Subject |
Electrons; Tunneling events; Electrostatic force microscopy |
| Subject LCSH |
Electrostatics; Microscopy; Tunneling (Physics) |
| Language |
eng |
| Bibliographic Citation |
Klein, L. J.,Williams, C. C. & Kim, J. (2000). Electron tunneling detected by electrostatic force. Applied Physics Letters, 77, 3615. |
| Rights Management |
©American Institute of Physics. The following article appeared in Klein, L. J.,Williams, C. C. & Kim, J. Applied Physics Letters, 77, 2000. and may be found at http://link.aip.org/?APPLAB/77/3615/1 |
| Format Medium |
application/pdf |
| Format Extent |
56,940 Bytes |
| Identifier |
ir-main,5156 |
| ARK |
ark:/87278/s6cr6brs |
| Setname |
ir_uspace |
| ID |
704835 |
| Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6cr6brs |
