Stochastic cycle period analysis in timed circuits

Update Item Information
Publication Type Journal Article
School or College College of Engineering
Department Electrical & Computer Engineering
Creator Myers, Chris J.
Other Author Mercer, Eric G.
Title Stochastic cycle period analysis in timed circuits
Date 1999
Description This paper presents the stochastic cycle period as a performance metric for timed asynchronous circuits. The stochastic cycle period is a sum of weighted delays whose value represents the expected delay of a single cycle in the specification. Each weight denotes the amount of time a delay contributes to the cycle of the circuit when the circuit is in steady-state operation. This paper demonstrates how the stochastic cycle period is used to aggressively optimize timed circuits for average-case performance. It shows the use of the stochastic cycle period to restrict out low probability triggers, optimally order pins, and size transistors in gate implementations. All optimization efforts are focused to improve the average-case delay in the timed asynchronous circuit, at the possible expense of the worst-case delay. In addition, this paper shows the calculation of the stochastic cycle period and proposes a new method for calculating trigger probabilities in timed circuits. This new method is simulation based, does not require the timed state space of the specification, and can be applied to any arbitrary Petri not.
Type Text
Publisher Institute of Electrical and Electronics Engineers (IEEE)
First Page 1
Last Page 4
Language eng
Bibliographic Citation Mercer, E. G., & Myers, C. J. (1999). Stochastic cycle period analysis in timed circuits. Proc. International Symposium on Circuits and Systems(ISCAS), 1-4. May.
Rights Management (c) 1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Format Medium application/pdf
Format Extent 126,047 bytes
Identifier ir-main,15038
ARK ark:/87278/s6kp8k8b
Setname ir_uspace
ID 702644
Reference URL https://collections.lib.utah.edu/ark:/87278/s6kp8k8b
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