Publication Type |
Journal Article |
School or College |
College of Engineering |
Department |
Materials Science & Engineering |
Creator |
Liu, Feng |
Other Author |
Zang, Ji |
Title |
Modified Timoshenko formula for bending of ultrathin strained bilayer films |
Date |
2008 |
Description |
Mechanical bending of nanoscale thin films can be quite different from that of macroscopic thick films. However, current understanding of mechanical bending of nanoscale thin strained bilayer films is often limited within the Timoshenko model [Timoshenko, J. Opt. Soc. Am. 11, 233 (1925)], which was originally derived for macroscopic thick films. Here, we derive a modified Timoshenko formula by including the prominent effect of surface stress played in the nanofilms, which gives a much better agreement with the experiments than the classical formula. |
Type |
Text |
Publisher |
American Institute of Physics (AIP) |
Journal Title |
Applied Physics Letters |
Volume |
92 |
Issue |
2 |
First Page |
21905 |
DOI |
10.1063/1.2828043 |
citatation_issn |
36951 |
Subject |
Timoshenko formula; Bending theory; Ultrathin films; Strained nanoscale thin films; Nanofilms |
Subject LCSH |
Flexure; Thin films; Nanostructured materials |
Language |
eng |
Bibliographic Citation |
Zang, J., & Liu, F. (2008). Modified Timoshenko formula for bending of ultrathin strained bilayer films. Applied Physics Letters, 92(2), 021905. |
Rights Management |
(c)American Institute of Physics. The following article appeared in Zang, J., & Liu, F., Applied Physics Letters, 92(2), 2008 and may be found at http://dx.doi.org/10.1063/1.2828043 |
Format Medium |
application/pdf |
Format Extent |
247,065 bytes |
Identifier |
ir-main,12122 |
ARK |
ark:/87278/s6k36c13 |
Setname |
ir_uspace |
ID |
704880 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6k36c13 |