Publication Type |
pre-print |
School or College |
College of Engineering |
Department |
Electrical & Computer Engineering |
Creator |
Tasdizen, Tolga |
Other Author |
Liu, Ting; Seyedhosseini, Mojtaba; Ellisman, Mark |
Title |
Watershed merge forest classification for electron microscopy image stack segmentation |
Date |
2013-01-01 |
Description |
Automated electron microscopy (EM) image analysis techniques can be tremendously helpful for connectomics research. In this paper, we extend our previous work [1] and propose a fully automatic method to utilize inter-section information for intra-section neuron segmentation of EM image stacks. A watershed merge forest is built via the watershed transform with each tree representing the region merging hierarchy of one 2D section in the stack. A section classifier is learned to identify the most likely region correspondence between adjacent sections. The inter-section information from such correspondence is incorporated to update the potentials of tree nodes. We resolve the merge forest using these potentials together with consistency constraints to acquire the final segmentation of the whole stack. We demonstrate that our method leads to notable segmentation accuracy improvement by experimenting with two types of EM image data sets. |
Type |
Text |
Publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
First Page |
4069 |
Last Page |
4073 |
Language |
eng |
Bibliographic Citation |
Liu, T., Seyedhosseini, M., Ellisman, M., & Tasdizen, T. (2013). Watershed merge forest classification for electron microscopy image stack segmentation. 2013 IEEE International Conference on Image Processing, ICIP 2013 - Proceedings, 6738838, 4069-73. |
Rights Management |
(c)2013 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Format Medium |
application/pdf |
Format Extent |
2,423,547 bytes |
Identifier |
uspace,18633 |
ARK |
ark:/87278/s69s513w |
Setname |
ir_uspace |
ID |
712521 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s69s513w |