Method for direct determination of the effective correlation energy of defects in semiconductors: optical modulation spectroscopy of dangling bonds

Update Item Information
Publication Type Journal Article
School or College College of Science
Department Physics
Creator Vardeny, Zeev Valentine
Other Author Tauc, J.
Title Method for direct determination of the effective correlation energy of defects in semiconductors: optical modulation spectroscopy of dangling bonds
Date 1985-04
Description The optical modulation technique is used for direct determination of energy levels and the effective correlation energy U/eff of dangling-bond defects. With an accuracy of 0.1 eV we found for the dangling-bond defect in α-Si:H, f/e f f=0.5 eV; in α-As2S3, £/e f f= - 1.0 eV; in As2Se3, Ueff = -0.7 eV; and in trans-(CH)x, Ueff=0.95 eV.
Type Text
Publisher American Physical Society
Journal Title Physical Review Letters
Volume 54
Issue 16
First Page 1844
Last Page 1847
DOI 10.1103/PhysRevLett.54.1844
citatation_issn 0031-9007
Subject Dangling bonds; Correlation energy
Subject LCSH Semiconductors -- Defects; Modulation spectroscopy
Language eng
Bibliographic Citation Vardeny, Z., V., & Tauc, J. (1985). Method for direct determination of the effective correlation energy of defects in semiconductors: optical modulation spectroscopy of dangling bonds. Physical Review Letters, 54(16), 1844-7.
Rights Management (c) American Physical Society http://dx.doi.org/10.1103/PhysRevLett.54.1844
Format Medium application/pdf
Format Extent 336,406 bytes
Identifier ir-main,9598
ARK ark:/87278/s6p565n9
Setname ir_uspace
ID 703096
Reference URL https://collections.lib.utah.edu/ark:/87278/s6p565n9
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