Publication Type |
pre-print |
School or College |
College of Engineering |
Department |
Mechanical Engineering |
Creator |
Roundy, Shadrach J. |
Other Author |
Bryzek, Janusz |
Title |
MEMS testing: transition from millions to billions to trillions |
Date |
2012-01-01 |
Description |
Sensors, specifically MEMSbased, have created multiple market tornados over the past 40 years. Most recently there has been a market explosion driven by the widespread adoption of MEMS sensing devices in mobile consumer applications. In the past 5 years the worldwide market has grown from roughly 10 million to 3 billion sensors in mobile devices, representing a growth rate of over 200%/ year. The total market is expected to grow to at least 16 billion sensors in the next 5 years, and a trillion sensors in 10 years. |
Type |
Text |
Publisher |
Chip Scale Review Magazine |
First Page |
1 |
Last Page |
3 |
Language |
eng |
Bibliographic Citation |
Bryzek, J., & Roundy, S. J. (2012). MEMS testing: transition from millions to billions to trillions. Chip Scale Review, 1-3 |
Rights Management |
(c) Chip Scale Review Magazine |
Format Medium |
application/pdf |
Format Extent |
497,307 bytes |
Identifier |
uspace,18278 |
ARK |
ark:/87278/s6bg36v8 |
Setname |
ir_uspace |
ID |
708823 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6bg36v8 |