Noncontact probes for wire fault location with reflectometry

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Publication Type Journal Article
School or College College of Engineering
Department Electrical & Computer Engineering
Creator Furse, Cynthia M.
Other Author Shang, Wu; Lo, Chet
Title Noncontact probes for wire fault location with reflectometry
Date 2006
Description This paper describes an approach to locate wire faults using reflectometry without physical contact with the wire conductor. This noncontact method is capable of locating faults on both dead and live powered wires with today's reflectometry technologies, and it does not require any modification or disconnection of the existing wiring system. With proper configuration, this method can detect wire faults with an accuracy of 3 in, which is comparable to direct connection systems.
Type Text
Publisher Institute of Electrical and Electronics Engineers (IEEE)
Journal Title IEEE Sensors Journal
Volume 6
Issue 6
First Page 1716
Last Page 1721
DOI 10.1109/JSEN.2006.884560
citatation_issn 1530-437X
Subject Wire fault location; Noncontact probes; Reflectometry; Capacitive coupling; Inductive coupling; Aging aircraft wire
Subject LCSH Airplanes -- Electric wiring; Electric wiring -- Inspection
Language eng
Bibliographic Citation Shang, W., Furse, C. M., & Lo, C. (2006). Noncontact probes for wire fault location with reflectometry. IEEE Sensors Journal, 6(6), 1716-21. Dec.
Rights Management (c) 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Format Medium application/pdf
Format Extent 651,511 bytes
Identifier ir-main,14079
ARK ark:/87278/s65q5dhw
Setname ir_uspace
ID 705499
Reference URL https://collections.lib.utah.edu/ark:/87278/s65q5dhw
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