Publication Type |
Journal Article |
School or College |
College of Engineering |
Department |
Materials Science & Engineering |
Creator |
Tiwari, Ashutosh |
Other Author |
Bhosle, V.; Narayan, J. |
Title |
Epitaxial growth and properties of MoOx(2<x<2.75) films |
Date |
2005 |
Description |
We report the growth of epitaxial molybdenum oxide (MoOx,2<x<2.75) films on c plane of sapphire substrate using pulsed laser deposition in oxygen environment. The structure was characterized using x-ray diffraction, high resolution transmission electron microscopy and x-ray photoelectron spectroscopy (XPS). Electrical resistivity and optical properties were investigated using four-point-probe resistivity measurements and spectroscopy techniques, respectively. It was found that the film had a monoclinic structure based on MoO2 phase and showed an unusual combination of high conductivity and high transmittance in the visible region after annealing. The unusual combination of these properties was realized by systematically controlling the relative fraction of different oxidation states of molybdenum, namely Mo4+, Mo5+, and Mo6+ in the monoclinic phase. For a film 60 nm thick and annealed at 250 °C for 1 h, the ratio of Mo6+ / (Mo4++Mo5+) was determined to be ~2.9/1 using XPS, and a typical value of transmittance was ~65% and resistivity close to 1310−3 Ω cm. These results demonstrate growth of epitaxial MoOx films with tunable electrical and optical properties. Further optimization of these properties is expected to result in applications related to display panels, solar cells, chromogenic (photochromic, electrochromic, gasochromic) devices, and transparent conducting oxides. Our ability to grow epitaxial MoOx films can further aid their integration with optoelectronic and photonic devices. |
Type |
Text |
Publisher |
American Institute of Physics (AIP) |
Journal Title |
Journal of Applied Physics |
Volume |
97 |
Issue |
8 |
First Page |
83539 |
DOI |
10.1063/1.1868852 |
citatation_issn |
218979 |
Subject |
Epitaxy; MoO |
Subject LCSH |
Metal oxide semiconductors; Zinc oxide; Thin films; Epitaxy; Semiconductor doping |
Language |
eng |
Bibliographic Citation |
Bhosle, V., Tiwari, A., & Narayan, J. (2005). Epitaxial growth and properties of MoOx(2<x<2.75) films. Journal of Applied Physics, 97(8), 083539. |
Rights Management |
(c)American Institute of Physics. The following article appeared in Bhosle, V., Tiwari, A., & Narayan, J., Journal of Applied Physics, 97(8), 2005 and may be found at http://dx.doi.org/10.1063/1.1868852 |
Format Medium |
application/pdf |
Format Extent |
664,306 bytes |
Identifier |
ir-main,12066 |
ARK |
ark:/87278/s6r78zxg |
Setname |
ir_uspace |
ID |
707102 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6r78zxg |