Publication Type |
Journal Article |
School or College |
College of Science |
Department |
Physics |
Creator |
Williams, Clayton C. |
Other Author |
Bussmann, E. |
Title |
Single electron tunneling force spectroscopy of an individual electronic state in a non-conducting surface |
Date |
2006 |
Description |
A tunneling spectroscopy technique to measure the energy level of an electronic state in a completely nonconducting surface is demonstrated. Spectroscopy is performed by electrostatic force detection of single-electron tunneling between a scanning probe and the state as a function of an applied voltage. An electronic state near the surface of a SiO2 film is found 5.5±0.2 eV below the conduction band edge. A random telegraph signal, caused by sporadic back-and-forth single-electron tunneling, is observed as the probe Fermi level passes through the state energy. |
Type |
Text |
Publisher |
American Institute of Physics (AIP) |
Subject |
Tunneling; Spectroscopy; Single electron; Scanning tunneling microscope |
Subject LCSH |
Tunneling spectroscopy; Tunneling (Physics) |
Language |
eng |
Bibliographic Citation |
Bussmann, E. & Williams, C. C. (2006). Single electron tunneling force spectroscopy of an individual electronic state in a non-conducting surface. Applied Physics Letters, 88, 263108. |
Rights Management |
(c)American Institute of Physics. The following article appeared in Bussmann, E. & Williams, C. C. Applied Physics Letters, 88, 2006. and may be found at http://link.aip.org/link/?APPLAB/88/263108/1 |
Format Medium |
application/pdf |
Format Extent |
135,680 Bytes |
Identifier |
ir-main,5145 |
ARK |
ark:/87278/s68k7tnz |
Setname |
ir_uspace |
ID |
706449 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s68k7tnz |