Publication Type |
Journal Article |
School or College |
College of Engineering |
Department |
Electrical & Computer Engineering |
Creator |
Furse, Cynthia M. |
Other Author |
Shang, Wu; Lo, Chet |
Title |
Noncontact probes for wire fault location with reflectometry |
Date |
2006 |
Description |
This paper describes an approach to locate wire faults using reflectometry without physical contact with the wire conductor. This noncontact method is capable of locating faults on both dead and live powered wires with today's reflectometry technologies, and it does not require any modification or disconnection of the existing wiring system. With proper configuration, this method can detect wire faults with an accuracy of 3 in, which is comparable to direct connection systems. |
Type |
Text |
Publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
Journal Title |
IEEE Sensors Journal |
Volume |
6 |
Issue |
6 |
First Page |
1716 |
Last Page |
1721 |
DOI |
10.1109/JSEN.2006.884560 |
citatation_issn |
1530-437X |
Subject |
Wire fault location; Noncontact probes; Reflectometry; Capacitive coupling; Inductive coupling; Aging aircraft wire |
Subject LCSH |
Airplanes -- Electric wiring; Electric wiring -- Inspection |
Language |
eng |
Bibliographic Citation |
Shang, W., Furse, C. M., & Lo, C. (2006). Noncontact probes for wire fault location with reflectometry. IEEE Sensors Journal, 6(6), 1716-21. Dec. |
Rights Management |
(c) 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Format Medium |
application/pdf |
Format Extent |
651,511 bytes |
Identifier |
ir-main,14079 |
ARK |
ark:/87278/s65q5dhw |
Setname |
ir_uspace |
ID |
705499 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s65q5dhw |